skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Wide Bandgap Extrinsic Photoconductive Switches

Thesis/Dissertation ·
DOI:https://doi.org/10.2172/1088462· OSTI ID:1088462
 [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Semi-insulating Gallium Nitride, 4H and 6H Silicon Carbide are attractive materials for compact, high voltage, extrinsic, photoconductive switches due to their wide bandgap, high dark resistance, high critical electric field strength and high electron saturation velocity. These wide bandgap semiconductors are made semi-insulating by the addition of vanadium (4H and 6HSiC) and iron (2H-GaN) impurities that form deep acceptors. These deep acceptors trap electrons donated from shallow donor impurities. The electrons can be optically excited from these deep acceptor levels into the conduction band to transition the wide bandgap semiconductor materials from a semi-insulating to a conducting state. Extrinsic photoconductive switches with opposing electrodes have been constructed using vanadium compensated 6H-SiC and iron compensated 2H-GaN. These extrinsic photoconductive switches were tested at high voltage and high power to determine if they could be successfully used as the closing switch in compact medical accelerators.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
1088462
Report Number(s):
LLNL-TH-640323
Country of Publication:
United States
Language:
English

Similar Records

6H-SiC Photoconductive Switches Triggered at Below Bandgap Wavelengths
Journal Article · Tue Feb 13 00:00:00 EST 2007 · IEEE Transactions on Dielectrics and Electrical Insulation, vol. 14, no. 4, August 1, 2007, NA · OSTI ID:1088462

Wide Bandgap Extrinsic Photoconductive Switches
Thesis/Dissertation · Fri Jan 20 00:00:00 EST 2012 · OSTI ID:1088462

High temperature annealing effects on deep-level defects in a high purity semi-insulating 4H-SiC substrate
Journal Article · Tue Jul 28 00:00:00 EDT 2015 · Journal of Applied Physics · OSTI ID:1088462

Related Subjects