A new diffractometer for high energy synchrotron radiation at the elliptical multipole wiggler at the APS.
The use of high energy synchrotrons radiation (above 80 keV) for diffraction experiments offers many advantages resulting from the high penetration depth of the high energy photons and the small Bragg angles. The main features are: the possibility for the study of large sample crystals in transmission geometry, simple sample environments, high instrumental resolution in reciprocal space, the ability to utilize high momentum transfers and small correction factors for scattered intensities. The experiments performed at this kind of diffractometer are mainly flux experiments, in which the only requirement is a relatively small angular divergence for the incident beam in the scattering plane. The new triple crystal diffractometer introduced here will be installed at the elliptical multipole wiggler beamline at the Advanced Photon Source (APS), Because of the high critical energy of this device, 32 keV, the wiggler will produce high intensities at very high photon energies. To collect up to 1 mrad of the horizontal divergence of the beam, a bent annealed silicon monochromator will scatter and focus in the horizontal scattering plane. The diffractometer will be operated in the vertical scattering plane taking advantage of the small vertical beam divergence.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10703
- Report Number(s):
- ANL/MSD/CP-95961; TRN: US0103813
- Resource Relation:
- Conference: SPIE International Symposium, San Diego, CA (US), 07/19/1998--07/24/1998; Other Information: PBD: 6 Aug 1998
- Country of Publication:
- United States
- Language:
- English
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