Ponderomotive phase plate for transmission electron microscopes

Reed, Bryan W

Title: Ponderomotive phase plate for transmission electron microscopes

Patent · Tue Jul 10 00:00:00 EDT 2012

OSTI ID:1069101

Reed, Bryan W ^[1]

Livermore, CA

A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC52-07NA27344

Assignee:: Lawrence Livermore National Security, LLC (Livermore, CA)

Patent Number(s):: 8,217,352

Application Number:: 12/881,075

OSTI ID:: 1069101

Country of Publication:: United States

Language:: English

References (10)

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Phase contrast electron microscopy: development of thin-film phase plates and biological applications Nagayama, Kuniaki; Danev, Radostin Philosophical Transactions of the Royal Society B: Biological Sciences, Vol. 363, Issue 1500 https://doi.org/10.1098/rstb.2008.2268	journal	March 2008
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM) LaGrange, Thomas; Campbell, Geoffrey H.; Reed, B. W. Ultramicroscopy, Vol. 108, Issue 11, p. 1441-1449 https://doi.org/10.1016/j.ultramic.2008.03.013	journal	October 2008
Status and issues of electron projection lithography Yamabe, Masaki Journal of Micro/Nanolithography, MEMS, and MOEMS, Vol. 4, Issue 1 https://doi.org/10.1117/1.1862648	journal	January 2005
Single-shot dynamic transmission electron microscopy LaGrange, T.; Armstrong, M. R.; Boyden, K. Applied Physics Letters, Vol. 89, Issue 4 https://doi.org/10.1063/1.2236263	journal	July 2006
Contrast Enhancement by Anamorphotic Phase Plates in an Aberration Corrected TEM Schröder, R. R.; Barton, B.; Rose, H. Microscopy and Microanalysis, Vol. 13, Issue S03 https://doi.org/10.1017/S143192760708004X	journal	September 2007
Femtosecond electron pulse characterization using laser ponderomotive scattering Hebeisen, Christoph T.; Ernstorfer, Ralph; Harb, Maher Optics Letters, Vol. 31, Issue 23 https://doi.org/10.1364/OL.31.003517	journal	January 2006
PREVAIL—Electron projection technology approach for next-generation lithography Dhaliwal, R. S.; Enichen, W. A.; Golladay, S. D. IBM Journal of Research and Development, Vol. 45, Issue 5 https://doi.org/10.1147/rd.455.0615	journal	September 2001
Attosecond electron pulses for 4D diffraction and microscopy Baum, P.; Zewail, A. H. Proceedings of the National Academy of Sciences, Vol. 104, Issue 47 https://doi.org/10.1073/pnas.0709019104	journal	November 2007
Temporal lenses for attosecond and femtosecond electron pulses Hilbert, S. A.; Uiterwaal, C.; Barwick, B. Proceedings of the National Academy of Sciences, Vol. 106, Issue 26 https://doi.org/10.1073/pnas.0904912106	journal	June 2009

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