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Title: Numerical Simulations of Transverse Beam Diffusion Enhancement by the Use of Electron Lens in the Tevatron Collider

Conference · · Conf.Proc.C1205201:1113-1115,2012
OSTI ID:1048428

Transverse beam diffusion for the Tevatron machine has been calculated using the Lifetrac code. The following effects were included: random noise (representing residual gas scattering, voltage noise in the accelerating cavities) lattice nonlinearities and beam-beam interactions. The time evolution of particle distributions with different initial amplitudes in Hamiltonian action has been simulated for 6 million turns, corresponding to a time of about 2 minutes. For each particle distribution, several cases have been considered: a single beam in storage ring mode, the collider case and the effects of a hollow electron beam collimator. The diffusion coefficient for some representative points in the amplitude space has been calculated by fitting the time evolution of delta-like particle distributions using the diffusion equation, for different machine conditions. The results confirm a strong efficiency of the electron lens as an halo diffusive enhancer, leading to diffusion coefficients which are at least a factor 10K higher than the values obtained for the collision case. This result is confirmed by the Frequency Map Analysis, which shows a clear intensification of resonance lines for particle amplitudes larger than the electron lens inner radius. If compared with past experiments, the simulations successfully reproduce the diffusion coefficients for the beam core, but still present a large discrepancy for halo particles, still under investigation.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1048428
Report Number(s):
FERMILAB-CONF-12-162-APC; TRN: US1204197
Journal Information:
Conf.Proc.C1205201:1113-1115,2012, Conference: Presented at the 3rd International Particle Accelerator Conference (IPAC-2012), New Orleans, Louisiana, 20-25 May 2012
Country of Publication:
United States
Language:
English