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Title: Measurement of the temperature of cold highly charged ions produced in an electron beam ion trap

Conference ·
OSTI ID:104784

The temperature of highly charged titanium ions produced and trapped in an electron beam ion trap was determined by precisely measuring the broadening of the emission line profile caused by the thermal Doppler motion. The measured temperature ranges from about 700 eV for deeply trapped ions to about 70 eV for ions in a shallow trap. The latter value represents the lowest temperature at which the x-ray emission of collisonally excited heliumlike Ti{sup 20}+ ions has ever been recorded, and the measured transitions represent the narrowest x-ray lines observed from highly charged titanium ions.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
104784
Report Number(s):
UCRL-JC-118362; CONF-940922-9; ON: DE95011727
Resource Relation:
Conference: 7. international conference on physics of highly charged ions, Vienna (Austria), 19-23 Sep 1994; Other Information: PBD: 14 Sep 1994
Country of Publication:
United States
Language:
English