buffer Layer Growth, the Thickness Dependence of Jc in Coated Conductors, Local Identification of Current Limiting Mechanisms and Participation in the Wire Development Group
The primary thrusts of our work were to provide critical understanding of how best to enhance the current-carrying capacity of coated conductors. These include the deconstruction of Jc as a function of fim thickness, the growth of in situ films incorporating strong pinning centers and the use of a suite of position-sensitive tools that enable location and analysis of key areas where current-limiting occurs.
- Research Organization:
- Florida State Univ., Tallahassee, FL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- FC07-08ID14916
- OSTI ID:
- 1031724
- Report Number(s):
- DOE/ID/14916; TRN: US201201%%799
- Country of Publication:
- United States
- Language:
- English
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