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Title: Phase-resolved x-ray ferromagnetic resonance measurements in fluorescence yield

Journal Article · · Journal of Applied Physics
OSTI ID:1026802

Phase-resolved x-ray ferromagnetic resonance (XFMR) has been measured in fluorescence yield, extending the application of XFMR to opaque samples on opaque substrates. Magnetization dynamics were excited in a Co{sub 50}Fe{sub 50}(0.7)/Ni{sub 90}Fe{sub 10}(5) bilayer by means of a continuous wave microwave excitation, while x-ray magnetic circular dichroism (XMCD) spectra were measured stroboscopically at different points in the precession cycle. By tuning the x-ray energy to the L{sub 3} edges of Ni and Fe, the dependence of the real and imaginary components of the element specific magnetic susceptibility on the strength of an externally applied static bias field was determined. First results from measurements on a Co{sub 50}Fe{sub 50}(0.7)/Ni{sub 90}Fe{sub 10}(5)/Dy(1) sample confirm that enhanced damping results from the addition of the Dy cap.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
Advanced Light Source Division
DOE Contract Number:
DE-AC02-05CH11231
OSTI ID:
1026802
Report Number(s):
LBNL-4768E; JAPIAU; TRN: US1105133
Journal Information:
Journal of Applied Physics, Vol. 109, Issue 7; ISSN 0021-8979
Country of Publication:
United States
Language:
English