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Title: Void fraction instrument acceptance test procedure

Technical Report ·
DOI:https://doi.org/10.2172/10190451· OSTI ID:10190451

This acceptance test procedure (ATP) was written to test the void fraction instrument (VFI) and verify that the unit is ready for field service. The procedure verifies that the mechanical and electrical features (not specifically addressed in the software ATP) and software alarms are operating as designed.

Research Organization:
Westinghouse Hanford Co., Richland, WA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC06-87RL10930
OSTI ID:
10190451
Report Number(s):
WHC-SD-WM-ATP-103; ON: DE95001514; TRN: 94:021194
Resource Relation:
Other Information: PBD: 15 Sep 1994
Country of Publication:
United States
Language:
English