Characterization of CCD-based imaging x-ray detectors for diffraction experiments
High resolution CCD-based imaging detectors are successfully used in X-ray diffraction experiments. Some of the detectors are commercially available, others have been developed by research groups around the world. Reliable comparison of the performance must be based on through testing of all relevant characteristics of these detectors. We describe methods of measurements of detector parameters such as conversion gain, linearity, uniformity, point spread function, geometrical uniformity, dark current, and detective quantum efficiency. As an example for the characterization, test results of a single module fiberoptic taper/CCD X-ray detector will be presented. The projected performance of a large area, array detector consisting of 9 CCD`s and fiberoptic taper modules, will be given. This new detector (the ``Gold`` detector) will be installed on Beamline X8C at the Brookhaven National Laboratory at the NSLS Synchrotron.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10187697
- Report Number(s):
- ANL/ECT/CP-80138; CONF-930824-6; ON: DE93041343; TRN: 93:023963
- Resource Relation:
- Journal Volume: 347; Journal Issue: 1-3; Conference: Synchrotron radiation instrumentation, Gaithersburg, MD (United States), 23-26 Aug 1993; Other Information: PBD: [1993]
- Country of Publication:
- United States
- Language:
- English
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SUPERCONDUCTIVITY AND SUPERFLUIDITY
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