X-ray studies of microstructures in semiconductors and superconducting materials

Technical Report · Wed Apr 01 00:00:00 EST 1992

DOI:https://doi.org/10.2172/10187452· OSTI ID:10187452

Kao, Y H

Objective is to use synchrotron x rays to probe short-range-order (SRO) structures in these materials. These SRO structures, with a scale of a few angstroms, include these around interfaces in multilayers, strain and local environs around impurity or constituent atoms, as well as lattice mismatch, intermixing of atoms across interfaces, annealing, etc. A new soft x-ray detector has been built and was used to measure x-ray fluorescence from O and F in bulk materials. The research on microstructure in both semiconductors and high-T{sub c} superconductors is being continued with emphasis on multilayer materials. X-ray absorption fine structure spectroscopy is being used in many of the studies, as is grazing incidence x-ray fluorescence and scattering. Total electron yield is used with fluorescence to probe surfaces and interfaces. Effects of doping on superconducting properties, especially these related to microstructures around impurities or constituent atoms, were studied. Resulting papers are listed.

• Research Organization: State Univ. of New York, Buffalo, NY (United States). Dept. of Physics and Astronomy
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-87ER45283
• OSTI ID: 10187452
• Report Number(s): DOE/ER/45283-11; ON: DE93001953
• Resource Relation: Other Information: PBD: Apr 1992
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
HIGH-TC SUPERCONDUCTORS
STRUCTURAL CHEMICAL ANALYSIS
SEMICONDUCTOR MATERIALS
PROGRESS REPORT
SYNCHROTRON RADIATION
SOFT X RADIATION
MICROSTRUCTURE
ABSORPTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY DETECTION
INTERFACES
FINE STRUCTURE
SURFACES
LAYERS
360202
360207
360602
STRUCTURE AND PHASE STUDIES