Optical characterization of sputtered carbon films
Conference
·
OSTI ID:10183595
Spattered carbon films are widely used as protective overcoats for thin film disk media. Raman spectroscopy is nondestructive and relatively rapid and is well suited for the characterization of carbon films. Specific features in the Raman spectra are empirically correlated with the rates of specific types of mechanical wear for both hydrogenated and unhydrogenated films. This observation is interpreted in terms of a random covalent network, in which the mechanical performance of the film is determined by the nature of the bonding that links sp{sup 2}-bonded domains.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 10183595
- Report Number(s):
- LBL-32388; CONF-9207153-1; ON: DE92041209
- Resource Relation:
- Conference: Institute of Electrical and Electronic Engineers (IEEE) magnetic recording conference,Santa Clara, CA (United States),21-23 Jul 1992; Other Information: PBD: May 1992
- Country of Publication:
- United States
- Language:
- English
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