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Title: Atomic-resolution characterization of interface structure and chemistry in the STEM

Abstract

Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO{sub 3} bicrystal.

Authors:
; ; ; ;  [1]; ;  [2]
  1. Oak Ridge National Lab., TN (United States)
  2. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10178342
Report Number(s):
CONF-940766-8
ON: DE94017753
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Conference
Resource Relation:
Conference: 13. international congress on electron microscopy,Paris (France),17-22 Jul 1994; Other Information: PBD: Mar 1994
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STRONTIUM TITANATES; GRAIN BOUNDARIES; INTERFACES; BICRYSTALS; ENERGY-LOSS SPECTROSCOPY; 360602; STRUCTURE AND PHASE STUDIES

Citation Formats

Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, and Dravid, V P. Atomic-resolution characterization of interface structure and chemistry in the STEM. United States: N. p., 1994. Web.
Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, & Dravid, V P. Atomic-resolution characterization of interface structure and chemistry in the STEM. United States.
Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, and Dravid, V P. 1994. "Atomic-resolution characterization of interface structure and chemistry in the STEM". United States. https://www.osti.gov/servlets/purl/10178342.
@article{osti_10178342,
title = {Atomic-resolution characterization of interface structure and chemistry in the STEM},
author = {Browning, N D and McGibbon, M M and McGibbon, A J and Chisholm, M F and Pennycook, S J and Ravikumar, V and Dravid, V P},
abstractNote = {Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO{sub 3} bicrystal.},
doi = {},
url = {https://www.osti.gov/biblio/10178342}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 01 00:00:00 EST 1994},
month = {Tue Mar 01 00:00:00 EST 1994}
}

Conference:
Other availability
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