Atomic-resolution characterization of interface structure and chemistry in the STEM
Abstract
Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO{sub 3} bicrystal.
- Authors:
-
- Oak Ridge National Lab., TN (United States)
- Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
- Publication Date:
- Research Org.:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Org.:
- USDOE, Washington, DC (United States)
- OSTI Identifier:
- 10178342
- Report Number(s):
- CONF-940766-8
ON: DE94017753
- DOE Contract Number:
- AC05-84OR21400
- Resource Type:
- Conference
- Resource Relation:
- Conference: 13. international congress on electron microscopy,Paris (France),17-22 Jul 1994; Other Information: PBD: Mar 1994
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; STRONTIUM TITANATES; GRAIN BOUNDARIES; INTERFACES; BICRYSTALS; ENERGY-LOSS SPECTROSCOPY; 360602; STRUCTURE AND PHASE STUDIES
Citation Formats
Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, and Dravid, V P. Atomic-resolution characterization of interface structure and chemistry in the STEM. United States: N. p., 1994.
Web.
Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, & Dravid, V P. Atomic-resolution characterization of interface structure and chemistry in the STEM. United States.
Browning, N D, McGibbon, M M, McGibbon, A J, Chisholm, M F, Pennycook, S J, Ravikumar, V, and Dravid, V P. 1994.
"Atomic-resolution characterization of interface structure and chemistry in the STEM". United States. https://www.osti.gov/servlets/purl/10178342.
@article{osti_10178342,
title = {Atomic-resolution characterization of interface structure and chemistry in the STEM},
author = {Browning, N D and McGibbon, M M and McGibbon, A J and Chisholm, M F and Pennycook, S J and Ravikumar, V and Dravid, V P},
abstractNote = {Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO{sub 3} bicrystal.},
doi = {},
url = {https://www.osti.gov/biblio/10178342},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 01 00:00:00 EST 1994},
month = {Tue Mar 01 00:00:00 EST 1994}
}
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