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Title: Measurement of residual stresses on ceramic materials with high spatial resolution

Abstract

A fast x-ray diffraction technique has been developed for measuring the residual stresses with high spatial resolution in ceramic materials. This resolution is limited by the mean size of grains and the radiation type. The effective diffraction elastic constants were experimentally determined for alumina as (E/l+{nu})){sub (1016)} = 200 GPa. The accuracy of XRD measurement of residual stresses with the spatial resolution of 170 {mu}m and precision {plus_minus} 15 MPa was verified experimentally by strain gauge measurements. The stress field around a singular Kovar pin brazed to alumina was asymmetric with high tangential stresses in the vicinity of the pin decreasing with the distance from the pin.

Authors:
 [1]; ;  [2]
  1. Oak Ridge National Lab., TN (United States)
  2. Pennsylvania State Univ., University Park, PA (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10177987
Report Number(s):
CONF-930685-1
ON: DE94017889
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Conference
Resource Relation:
Conference: 6. international symposium on nondestructive characterization of materials,Oahu, HI (United States),7-11 Jun 1993; Other Information: PBD: [1993]
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CERAMICS; RESIDUAL STRESSES; MEASURING METHODS; X-RAY DIFFRACTION; 360203; MECHANICAL PROPERTIES

Citation Formats

Kozaczek, K J, Ruud, C O, and Fitting, J D. Measurement of residual stresses on ceramic materials with high spatial resolution. United States: N. p., 1993. Web.
Kozaczek, K J, Ruud, C O, & Fitting, J D. Measurement of residual stresses on ceramic materials with high spatial resolution. United States.
Kozaczek, K J, Ruud, C O, and Fitting, J D. 1993. "Measurement of residual stresses on ceramic materials with high spatial resolution". United States. https://www.osti.gov/servlets/purl/10177987.
@article{osti_10177987,
title = {Measurement of residual stresses on ceramic materials with high spatial resolution},
author = {Kozaczek, K J and Ruud, C O and Fitting, J D},
abstractNote = {A fast x-ray diffraction technique has been developed for measuring the residual stresses with high spatial resolution in ceramic materials. This resolution is limited by the mean size of grains and the radiation type. The effective diffraction elastic constants were experimentally determined for alumina as (E/l+{nu})){sub (1016)} = 200 GPa. The accuracy of XRD measurement of residual stresses with the spatial resolution of 170 {mu}m and precision {plus_minus} 15 MPa was verified experimentally by strain gauge measurements. The stress field around a singular Kovar pin brazed to alumina was asymmetric with high tangential stresses in the vicinity of the pin decreasing with the distance from the pin.},
doi = {},
url = {https://www.osti.gov/biblio/10177987}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Dec 31 00:00:00 EST 1993},
month = {Fri Dec 31 00:00:00 EST 1993}
}

Conference:
Other availability
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