Measurement of residual stresses on ceramic materials with high spatial resolution
Abstract
A fast x-ray diffraction technique has been developed for measuring the residual stresses with high spatial resolution in ceramic materials. This resolution is limited by the mean size of grains and the radiation type. The effective diffraction elastic constants were experimentally determined for alumina as (E/l+{nu})){sub (1016)} = 200 GPa. The accuracy of XRD measurement of residual stresses with the spatial resolution of 170 {mu}m and precision {plus_minus} 15 MPa was verified experimentally by strain gauge measurements. The stress field around a singular Kovar pin brazed to alumina was asymmetric with high tangential stresses in the vicinity of the pin decreasing with the distance from the pin.
- Authors:
-
- Oak Ridge National Lab., TN (United States)
- Pennsylvania State Univ., University Park, PA (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Org.:
- USDOE, Washington, DC (United States)
- OSTI Identifier:
- 10177987
- Report Number(s):
- CONF-930685-1
ON: DE94017889
- DOE Contract Number:
- AC05-84OR21400
- Resource Type:
- Conference
- Resource Relation:
- Conference: 6. international symposium on nondestructive characterization of materials,Oahu, HI (United States),7-11 Jun 1993; Other Information: PBD: [1993]
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; CERAMICS; RESIDUAL STRESSES; MEASURING METHODS; X-RAY DIFFRACTION; 360203; MECHANICAL PROPERTIES
Citation Formats
Kozaczek, K J, Ruud, C O, and Fitting, J D. Measurement of residual stresses on ceramic materials with high spatial resolution. United States: N. p., 1993.
Web.
Kozaczek, K J, Ruud, C O, & Fitting, J D. Measurement of residual stresses on ceramic materials with high spatial resolution. United States.
Kozaczek, K J, Ruud, C O, and Fitting, J D. 1993.
"Measurement of residual stresses on ceramic materials with high spatial resolution". United States. https://www.osti.gov/servlets/purl/10177987.
@article{osti_10177987,
title = {Measurement of residual stresses on ceramic materials with high spatial resolution},
author = {Kozaczek, K J and Ruud, C O and Fitting, J D},
abstractNote = {A fast x-ray diffraction technique has been developed for measuring the residual stresses with high spatial resolution in ceramic materials. This resolution is limited by the mean size of grains and the radiation type. The effective diffraction elastic constants were experimentally determined for alumina as (E/l+{nu})){sub (1016)} = 200 GPa. The accuracy of XRD measurement of residual stresses with the spatial resolution of 170 {mu}m and precision {plus_minus} 15 MPa was verified experimentally by strain gauge measurements. The stress field around a singular Kovar pin brazed to alumina was asymmetric with high tangential stresses in the vicinity of the pin decreasing with the distance from the pin.},
doi = {},
url = {https://www.osti.gov/biblio/10177987},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Dec 31 00:00:00 EST 1993},
month = {Fri Dec 31 00:00:00 EST 1993}
}
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