The role of point defects and defect complexes in silicon device processing. Summary report and papers
Abstract
This report is the summary of the third workshop on the role of point defects and defect complexes in silicon device processing. The workshop was organized: (1) to discuss recent progress in the material quality produced by photovoltaic Si manufacturers, (2) to foster the understanding of point defect issues in Si device processing, (3) to review the effects of inhomogeneities on large- area solar cell performance, (4) to discuss how to improve Si solar cell processing, and (5) to develop a new understanding of gettering, defect passivation, and defect annihilation. Separate abstract were prepared for the individual papers, for the database.
- Authors:
- Publication Date:
- Research Org.:
- National Renewable Energy Lab., Golden, CO (United States)
- Sponsoring Org.:
- USDOE, Washington, DC (United States)
- OSTI Identifier:
- 10177722
- Report Number(s):
- NREL/TP-413-7061; CONF-9308193-Summ.
ON: DE94011873; BR: WM1020000
- DOE Contract Number:
- AC36-83CH10093
- Resource Type:
- Conference
- Resource Relation:
- Conference: 4. international conference on circulating fluidized beds,Champion, PA (United States),1-5 Aug 1993; Other Information: PBD: Aug 1994
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; SILICON SOLAR CELLS; MEETINGS; LEADING ABSTRACT; 140501; PHOTOVOLTAIC CONVERSION
Citation Formats
Sopori, B, and Tan, T Y. The role of point defects and defect complexes in silicon device processing. Summary report and papers. United States: N. p., 1994.
Web.
Sopori, B, & Tan, T Y. The role of point defects and defect complexes in silicon device processing. Summary report and papers. United States.
Sopori, B, and Tan, T Y. 1994.
"The role of point defects and defect complexes in silicon device processing. Summary report and papers". United States. https://www.osti.gov/servlets/purl/10177722.
@article{osti_10177722,
title = {The role of point defects and defect complexes in silicon device processing. Summary report and papers},
author = {Sopori, B and Tan, T Y},
abstractNote = {This report is the summary of the third workshop on the role of point defects and defect complexes in silicon device processing. The workshop was organized: (1) to discuss recent progress in the material quality produced by photovoltaic Si manufacturers, (2) to foster the understanding of point defect issues in Si device processing, (3) to review the effects of inhomogeneities on large- area solar cell performance, (4) to discuss how to improve Si solar cell processing, and (5) to develop a new understanding of gettering, defect passivation, and defect annihilation. Separate abstract were prepared for the individual papers, for the database.},
doi = {},
url = {https://www.osti.gov/biblio/10177722},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Aug 01 00:00:00 EDT 1994},
month = {Mon Aug 01 00:00:00 EDT 1994}
}
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