Crystallographic and metallurgical characterization of radiation detector grade cadmium telluride materials

Conference · Tue Jun 01 00:00:00 EDT 1993

OSTI ID:10160893

Johnson, C J; Eissler, E E; Cameron, S E ^[1]; Kong, Y; Fan, S; Jovanovic, S; Lynn, K G ^[2]

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1. II-VI, Inc., Saxonburg, PA (United States). eV Products Div.
2. Brookhaven National Lab., Upton, NY (United States)

Radiation detector grade CdTe crystals are characterized by several crystallographic and metallurgical techniques including infrared microscopy, dislocation etch pitting and X-ray diffraction. Results are presented for a set of 50 detectors fabricated from an ingot produced by the High Pressure Bridgman method. Data on the temperature dependence of leakage current and pulse height analysis are presented, along with measurements of room temperature charge transport properties. Attempts to relate crystal structure to detector performance discussed.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10160893
• Report Number(s): BNL-48960; CONF-930405-11; ON: DE93014335
• Resource Relation: Conference: Spring meeting of the Materials Research Society,San Francisco, CA (United States),12-16 Apr 1993; Other Information: PBD: [1993]
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
36 MATERIALS SCIENCE
CDTE SEMICONDUCTOR DETECTORS
MATERIALS
CRYSTAL STRUCTURE
PERFORMANCE
ELECTRICAL PROPERTIES
FABRICATION
440100
360606
RADIATION INSTRUMENTATION
PHYSICAL PROPERTIES