Investigation of the oxygen-vacancy (A-center) defect complex profile in neutron irradiated high resistivity silicon junction particle detectors

Conference · Sat Feb 01 00:00:00 EST 1992

OSTI ID:10160548

Li, Zheng; Kraner, H W ^[1]; Verbitskaya, E; Eremin, V; Ivanov, A ^[2]; Rattaggi, M; Rancoita, P G ^[3]; Rubinelli, F A; Fonash, S J ^[4]; Dale, C; Marshall, P ^[5]

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1. Brookhaven National Lab., Upton, NY (United States)
2. AN SSSR, St. Petersburg (Russian Federation). Physico-Technical Inst.
3. Istituto Nazionale di Fisica Nucleare, Milan (Italy)
4. Pennsylvania State Univ., University Park, PA (United States). Center for Electronic Materials and Processing
5. Naval Research Lab., Washington, DC (United States)

Distributions of the A-center (oxygen-vacancy) in neutron silicon detectors have been studied using Deep Level Transient Spectroscopy. A-centers have been found to be nearly uniformly distributed in the silicon water depth for medium resistivity (0.1 {minus} 0.2 k{Omega}-cm) silicon detectors. A positive filling pulse was needed to detect the A-centers in high resistivity (>4 k{Omega}-cm) silicon detectors, and this effect was found to be dependent on the oxidation temperature. A discussion of this effect is presented. 16 refs.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10160548
• Report Number(s): BNL-47550; CONF-920716-5; ON: DE92016952
• Resource Relation: Conference: Nuclear and space radiation effects conference,New Orleans, LA (United States),13-17 Jul 1992; Other Information: PBD: Feb 1992
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
36 MATERIALS SCIENCE
SI SEMICONDUCTOR DETECTORS
DAMAGING NEUTRON FLUENCE
SILICON OXIDES
A CENTERS
SEMICONDUCTOR JUNCTIONS
SPECTROSCOPY
440200
440104
360202
RADIATION EFFECTS ON INSTRUMENT COMPONENTS
INSTRUMENTS
OR ELECTRONIC SYSTEMS
HIGH ENERGY PHYSICS INSTRUMENTATION
STRUCTURE AND PHASE STUDIES