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Title: Advances in low energy neutral atom imaging techniques

Conference ·
OSTI ID:10158742
; ; ;  [1];  [2]
  1. Los Alamos National Lab., NM (United States)
  2. University of Southern California, Los Angeles, CA (United States). Space Sciences Center

Recently proposed low energy neutral atom (LENA) imaging techniques use a collisional process to convert the low energy neutrals into ions before detection. At low energies, collisional processes limit the angular resolution and conversion efficiencies of these devices. However, if the intense ultraviolet light background can be suppressed, direct LENA detection is possible. We present results from a series of experiments designed to develop a novel filtering structure based on free-standing transmission gratings. If the grating period is sufficiently small, free standing transmission gratings can be employed to substantially polarize ultraviolet (UV) light in the wavelength range 300 {Angstrom} to 1500 {Angstrom}. If a second grating is placed behind the first grating with its axis of polarization oriented at a right angle to the first`s, a substantial attenuation of UV radiation is achievable. ne neutrals will pass through the remaining open area of two gratings and be detected without UV background complications. We have obtained nominal 2000 {Angstrom} period (1000 {Angstrom} bars with 1000 {Angstrom} slits) free standing, gold transmission gratings and measured their UV and atomic transmission characteristics. The geometric factor of a LENA imager based on this technology is comparable to that of other proposed LENA imagers. In addition, this of imager does not distort the neutral trajectories, allowing for high angular resolution.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
10158742
Report Number(s):
LA-UR-93-1508; CONF-930722-2; ON: DE93012745
Resource Relation:
Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers (SPIE),San Diego, CA (United States),11-16 Jul 1993; Other Information: PBD: [1993]
Country of Publication:
United States
Language:
English