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Title: Imaging AMS

Conference ·
OSTI ID:10123586

The benefits of simultaneous high effective mass resolution and large spectrometer acceptance that accelerator mass spectrometry has afforded the bulk analysis of material samples by secondary ion mass spectrometry may also be applied to imaging SIMS. The authors are exploring imaging AMS with the addition to the Oxford {sup 14}C-AMS system of a scanning secondary ion source. It employs a sub micron probe and a separate Cs flood to further increase the useful ion yield. The source has been accommodated on the system by directly injecting sputtered ions into the accelerator without mass analysis. They are detected with a range of devices including new high-bandwidth detectors. Qualitative mass spectra may be easily generated by varying only the post-accelerator analysis magnet. Selected ion signals may be used for imaging. In developing the instrument for bioscience research the authors are establishing its capability for measuring the lighter elements prevalent in biological tissue. Importantly, the machine can map the distributions of radiocarbon labeled compounds with an efficiency of about 1{per_thousand}. A background due to misidentification of non-{sup 14}C ions as a result of the reduced ion mass filtering is too small to hinder high magnification microscopy.

Research Organization:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
10123586
Report Number(s):
UCRL-JC-115791; CONF-930960-9; ON: DE94006662; TRN: 94:002887
Resource Relation:
Conference: 6. international conference on accelerator mass spectrometry,Canberra (Australia),17 Sep - 1 Oct 1993; Other Information: PBD: Dec 1993
Country of Publication:
United States
Language:
English