Analysis of surfaces, films and multilayers by resonant laser ablation

Conference · Wed Feb 01 00:00:00 EST 1995

OSTI ID:10120268

Allen, T M; Smith, C H; Kelly, P B ^[1]; Anderson, J E; Eiden, G C; Garrett, A W; Gill, C G; Hemberger, P H; Nogar, N S ^[2]

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1. Univ. of California, Davis, CA (United States). Dept. of Chemistry
2. Los Alamos National Lab., NM (United States)

In this manuscript we review briefly the history of Resonant Laser Ablation (RLA), and discuss some current ideas regarding sample preparation, laser parameters, and mechanisms. We also discuss current applications including spectral analysis of trace components, depth profiling of thin films and multilayer structures, and the use of RLA with the Ion Trap Mass Spectrometer (ITMS).

• Research Organization: Los Alamos National Lab., NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 10120268
• Report Number(s): LA-UR-95-116; CONF-950226-9; ON: DE95006295; TRN: 95:002231
• Resource Relation: Conference: SPIE `95: SPIE conference on optics, electro-optics, and laser application in science, engineering and medicine,San Jose, CA (United States),5-14 Feb 1995; Other Information: PBD: [1995]
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
74 ATOMIC AND MOLECULAR PHYSICS
ALLOYS
LASER SPECTROSCOPY
TEMPERATURE MEASUREMENT
MULTI-ELEMENT ANALYSIS
ABLATION
THIN FILMS
MASS SPECTROSCOPY
SAMPLE PREPARATION
SURFACE IONIZATION
POLARIZATION
SURFACE PROPERTIES
IMPURITIES
QUANTITATIVE CHEMICAL ANALYSIS
RESONANCE
LAMELLAE
TRACE AMOUNTS
400102
664200
CHEMICAL AND SPECTRAL PROCEDURES
SPECTRA OF ATOMS AND MOLECULES AND THEIR INTERACTIONS WITH PHOTONS