Photodesorption from copper, beryllium and thin films
Ever increasing circulating currents in electron-positron colliders and light sources demand lower and lower photodesportion (PSD) from the surfaces of their vacuum chambers and their photon absorbers. This is particularly important in compact electron storage rings and B meson factories where photon power of several kw cm{sup {minus}1} is deposited on the surfaces. Given the above factors we have measured PSD from 1m long bars of (1) solid copper and solid beryllium, and (2), TiN, Au and C thin films deposited on solid copper bars. Each sample was exposed to about 10{sup 23} photons/m with a critical energy of 500 eV at the VUV ring of the NSLS. PSD was recorded for two conditions: after a 200{degrees}C bake-out and after an Ar glow discharge cleaning. In addition, we also measured reflected photons, photoelectrons and desorption as functions of normal, 75 mrad, 100 mrad, and 125 mrad incident photons. 15 refs., 8 figs., 1 tab.
- Research Organization:
- Brookhaven National Lab., Upton, NY (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 10119107
- Report Number(s):
- BNL-46994; CONF-911132-18; ON: DE92007171
- Resource Relation:
- Conference: 38. national symposium of the American Vacuum Society,Seattle, WA (United States),11-15 Nov 1991; Other Information: PBD: [1991]
- Country of Publication:
- United States
- Language:
- English
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