skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Drift chamber tracking with neural networks

Conference ·
OSTI ID:10114138

We discuss drift chamber tracking with a commercial log VLSI neural network chip. Voltages proportional to the drift times in a 4-layer drift chamber were presented to the Intel ETANN chip. The network was trained to provide the intercept and slope of straight tracks traversing the chamber. The outputs were recorded and later compared off line to conventional track fits. Two types of network architectures were studied. Applications of neural network tracking to high energy physics detector triggers is discussed.

Research Organization:
Fermi National Accelerator Lab., Batavia, IL (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC02-76CH03000
OSTI ID:
10114138
Report Number(s):
FNAL/C-92/283; CONF-921005-16; ON: DE93004420
Resource Relation:
Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference,Orlando, FL (United States),25-31 Oct 1992; Other Information: PBD: Oct 1992
Country of Publication:
United States
Language:
English