A high resolution x-ray fluorescence spectrometer for near edge absorption studies

Conference · Tue Dec 31 00:00:00 EST 1991

OSTI ID:10109958

Stojanoff, V; Hamalainen, K; Siddons, D P; Hastings, J B; Berman, L E; Cramer, S; Smith, G

A high resolution fluorescence spectrometer using a Johann geometry in a back scattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near edge absorption spectrum of dysprosium nitrate. 10 refs., 4 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10109958
• Report Number(s): BNL-46809; CONF-910730-28; ON: DE92004991
• Resource Relation: Conference: 4. international conference on synchrotron radiation instrumentation,Chester (United Kingdom),15-19 Jul 1991; Other Information: PBD: [1991]
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
47 OTHER INSTRUMENTATION
X-RAY SPECTROMETERS
DYSPROSIUM NITRATES
X-RAY SPECTROSCOPY
FLUORESCENCE SPECTROSCOPY
X-RAY FLUORESCENCE ANALYSIS
BACKSCATTERING
ENERGY RESOLUTION
X-RAY SPECTRA
664200
440600
SPECTRA OF ATOMS AND MOLECULES AND THEIR INTERACTIONS WITH PHOTONS
OPTICAL INSTRUMENTATION