Electron yield XAFS study of evaporated Co/Pd multilayers with various thickness ratios of Co to Pd sublayers: Simulations of the Co K-edge XAFS and fourier transforms

Conference · Sun Nov 01 00:00:00 EST 1992

OSTI ID:10106451

Choi, M ^[1]; Joo, J H ^[2]; Kim, S K; Kang, J S; Lee, Y P ^[3]; Shin, S C ^[4]; Heald, S M ^[5]

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1. Catholic Univ. Medical Coll., Seoul (Korea, Republic of). Dept. of Physics
2. Korea Inst. of Science and Technology, Seoul (Korea, Republic of). Materials Design Lab.
3. Research Inst. of Industrial Science Technology, Pohang (Korea, Republic of)
4. Korea Advanced Inst. of Science and Technology, Seoul (Korea, Republic of)
5. Brookhaven National Lab., Upton, NY (United States)

Electron-yield XAFS measurements using the NSLS were made on e-beam evaporated Co/Pd multilayers with various sublayer thicknesses and different thickness ratios of Co to Pd sublayers. The Co K-edge and the Pd K-edge XAFS data were obtained for the Co/Pd multilayers with sublayer thicknesses of 3{Angstrom}/ 4{Angstrom}, 15{Angstrom}/4{Angstrom}, 3{Angstrom}/15{Angstrom}, 2.1{Angstrom}/13.5{Angstrom}, and 2.2{Angstrom}/4.5{Angstrom}. Fourier transforms of Co K XAFS for most samples show a splitting of major peak, and the magnitude ratio of these split peaks varies systematically with the thickness ratio of the Pd sublayer to the Co sublayer, whereas the Fourier transforms of the Pd K XAFS for the same samples do not show a splitting of peaks. As a preliminary analysis, the Co K XAFS and the split peaks in the Fourier transform for the Co/Pd(3{Angstrom}/4{Angstrom}) case were simulated by using the FEFF calculations, and the Co K XAFS and the major peak in the fourier transform for the Co/Pd(15{Angstrom}/4{Angstrom}) case were also simulated consistently.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); Korea Science and Engineering Foundation (Korea, Republic of)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10106451
• Report Number(s): BNL-48084; CONF-9208160-5; ON: DE93003142
• Resource Relation: Conference: 7. international conference on x-ray absorption fine structure,Kobe (Japan),23-29 Aug 1992; Other Information: PBD: 1992
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT
LAYERS
X-RAY SPECTRA
PALLADIUM
NSLS
FINE STRUCTURE
ELECTRONS
THICKNESS
PEAKS
FOURIER TRANSFORMATION
360104
PHYSICAL PROPERTIES