A conceptual design methodology for enhanced conformance quality

Conference · Sun Dec 31 00:00:00 EST 1995

OSTI ID:10106062

Hinckley, C M ^[1]; Barkan, P ^[2]

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1. Sandia National Labs., Livermore, CA (United States)
2. Stanford Univ., Stanford, CA (United States). Dept. of Mechanical Engineering

Traditional manufacturing practice has depended upon Statistical Process Control (SPC) to eliminate defects. However, our research demonstrates that these sampling based methods significantly underestimate the tails of a distribution. As a consequence of the limitations of SPC, mistakes require different methods of control to achieve defect rates in the tens of parts per million range. Furthermore, product complexity contributes to defects resulting from both mistakes and excess variation. Correlations between defects and complexity lead to a new opportunity for selecting superior product concepts.

• Research Organization: Sandia National Labs., Livermore, CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 10106062
• Report Number(s): SAND-95-8444C; CONF-950392-1; ON: DE95004383
• Resource Relation: Conference: National design engineering conference,Chicago, IL (United States),13-16 Mar 1995; Other Information: PBD: [1995]
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
MANUFACTURING
QUALITY CONTROL
PROCESS CONTROL
DESIGN
DEFECTS
RELIABILITY
420200
FACILITIES, EQUIPMENT, AND TECHNIQUES