Atom probe field ion microscopy and related topics: A bibliography 1992
This bibliography contains citations of books, conference proceedings, journals, and patents published in 1992 on the following types of microscopy: atom probe field ion microscopy (108 items); field emission microscopy (101 items); and field ion microscopy (48 items). An addendum of 34 items missed in previous bibliographies is included.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 10105826
- Report Number(s):
- ORNL/TM-12625; ON: DE94003475; TRN: AHC29402%%4
- Resource Relation:
- Other Information: PBD: Dec 1993
- Country of Publication:
- United States
- Language:
- English
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Atom probe field ion microscopy and related topics: A bibliography 1990
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Technical Report
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Sun Dec 01 00:00:00 EST 1991
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OSTI ID:10105826
Atom probe field ion microscopy and related topics: A bibliography 1990
Technical Report
·
Sun Dec 01 00:00:00 EST 1991
·
OSTI ID:10105826
Atom probe field ion microscopy and related topics: A bibliography 1993
Technical Report
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Sat Oct 01 00:00:00 EDT 1994
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OSTI ID:10105826
Related Subjects
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
42 ENGINEERING
ION MICROSCOPY
BIBLIOGRAPHIES
MATERIALS TESTING
ALLOYS
PHASE STUDIES
CERAMICS
COMPOSITE MATERIALS
SEMICONDUCTOR MATERIALS
SURFACE PROPERTIES
HIGH-TC SUPERCONDUCTORS
400102
360000
420500
CHEMICAL AND SPECTRAL PROCEDURES
MATERIALS
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
42 ENGINEERING
ION MICROSCOPY
BIBLIOGRAPHIES
MATERIALS TESTING
ALLOYS
PHASE STUDIES
CERAMICS
COMPOSITE MATERIALS
SEMICONDUCTOR MATERIALS
SURFACE PROPERTIES
HIGH-TC SUPERCONDUCTORS
400102
360000
420500
CHEMICAL AND SPECTRAL PROCEDURES
MATERIALS