Grain boundaries. Progress report, February 15, 1991--October 15, 1991

Technical Report · Tue Dec 31 00:00:00 EST 1991

DOI:https://doi.org/10.2172/10105655· OSTI ID:10105655

Balluffi, R W; Bristowe, P D

The present document is a progress report describing the work accomplished to date during the second year of our four-year grant (February 15, 1990--February 14, 1994) to study grain boundaries. The research was focused on the following three major efforts: Study of the atomic structure of grain boundaries by means of x-ray diffraction, transmission electron microscopy and computer modeling; study of short-circuit diffusion along grain boundaries; and development of a Thin-film Deposition/Bonding Apparatus for the manufacture of high purity bicrystals.

• Research Organization: Massachusetts Inst. of Tech., Cambridge, MA (United States). Dept. of Materials Science and Engineering
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-87ER45310
• OSTI ID: 10105655
• Report Number(s): DOE/ER/45310-35; ON: DE92004420
• Resource Relation: Other Information: PBD: [1991]
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GRAIN BOUNDARIES
TRANSMISSION ELECTRON MICROSCOPY
SEGREGATION
PROGRESS REPORT
X-RAY DIFFRACTION
GOLD
BICRYSTALS
GERMANIUM
COMPUTERIZED SIMULATION
SILICON
360102
STRUCTURE AND PHASE STUDIES