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  1. 3D and Multimodal X‐Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells

    Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficitmore » structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.« less
  2. Direct imaging of ultrafast lattice dynamics

    Under rapid high-temperature, high-pressure loading, lattices exhibit complex elastic-inelastic responses. The dynamics of these responses are challenging to measure experimentally because of high sample density and extremely small relevant spatial and temporal scales. In this work, we use an x-ray free-electron laser providing simultaneous in situ direct imaging and x-ray diffraction to spatially resolve lattice dynamics of silicon under high–strain rate conditions. We present the first imaging of a new intermediate elastic feature modulating compression along the axis of applied stress, and we identify the structure, compression, and density behind each observed wave. The ultrafast probe x-rays enabled time-resolved characterizationmore » of the intermediate elastic feature, which is leveraged to constrain kinetic inhibition of the phase transformation between 2 and 4 ns. These results not only address long-standing questions about the response of silicon under extreme environments but also demonstrate the potential for ultrafast direct measurements to illuminate new lattice dynamics.« less
  3. Simultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS

    In this paper, we demonstrate simultaneous phase-contrast imaging (PCI) and X-ray diffraction from shock compressed matter at the Matter in Extreme Conditions endstation, at the Linac Coherent Light Source (LCLS). We utilize the chromaticity from compound refractive X-ray lenses to focus the 24.6 keV 3rd order undulator harmonic of the LCLS to a spot size of 5 μm on target to perform X-ray diffraction. Simultaneous PCI from the 8.2 keV fundamental X-ray beam is used to visualize and measure the transient properties of the shock wave over a 500 μm field of view. Furthermore, we demonstrate the ability to extendmore » the reciprocal space measurements by 5 Å–1, relative to the fundamental X-ray energy, by utilizing X-ray diffraction from the 3rd harmonic of the LCLS.« less
  4. The phase-contrast imaging instrument at the matter in extreme conditions endstation at LCLS

    We describe the phase-contrast imaging instrument at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source. The instrument can image phenomena with a spatial resolution of a few hundreds of nanometers and at the same time reveal the atomic structure through X-ray diffraction, with a temporal resolution better than 100 fs. It was specifically designed for studies relevant to high-energy-density science and can monitor, e.g., shock fronts, phase transitions, or void collapses. This versatile instrument was commissioned last year and is now available to the MEC user community.

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