X-ray microscopy of polymeric materials

Conference · Fri Sep 01 00:00:00 EDT 1995

OSTI ID:99510

Ade, H; Smith, A P ^[1]; Hsiao, B; Cieslinski, R ^[2]; Mitchell, G ^[3]; Rightor, E ^[4]

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1. North Carolina State Univ., Raleigh, NC (United States). Dept. of Physics
2. DuPont, Wilmington, DE (United States). Experimental Station
3. Dow Chemical, Midland, MI (United States). Analytical Science Lab.
4. Dow Chemical, Freeport, TX (United States). Texas Polymer Center

The authors describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. They present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.

• OSTI ID: 99510
• Report Number(s): CONF-941144-; ISBN 1-55899-277-4; TRN: IM9539%%305
• Resource Relation: Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of Applications of synchrotron radiation techniques to materials science II; Terminello, L.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; Shinn, N.D. [ed.] [Sandia National Labs., Albuquerque, NM (United States)]; Ice, G.E. [ed.] [Oak Ridge National Lab., TN (United States)]; D`Amico, K.L. [ed.] [X-ray Analytics, Ltd., Hinsdale, IL (United States)]; Perry, D.L. [ed.] [Lawrence Berkeley Lab., CA (United States)]; PB: 349 p.; Materials Research Society symposium proceedings, Volume 375
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
POLYMERS
MORPHOLOGY
MICROSCOPY
PHASE STUDIES
PLASTICS
CHEMICAL BONDS
ABSORPTION SPECTROSCOPY
X RADIATION
POLYESTERS
POLYCARBONATES
POLYURETHANES
MICROSTRUCTURE
SURFACE PROPERTIES