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Title: Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer

Abstract

This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.

Authors:
Publication Date:
Research Org.:
National Security Technologies, LLC (United States)
Sponsoring Org.:
USDOE; USDOE National Nuclear Security Administration (NA)
OSTI Identifier:
993431
Report Number(s):
DOE/NV/25946-839
TRN: US1100007
DOE Contract Number:  
DE-AC52-06NA25946
Resource Type:
Journal Article
Journal Name:
X-Ray Optics and Instrumentation
Additional Journal Information:
Journal Volume: 2010
Publisher:
Hindawi Publishing Corporation
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DESIGN; DOPPLER BROADENING; GONIOMETERS; PLASMA; INERTIAL CONFINEMENT; KEV RANGE; MICA; PERFORMANCE; TESTING; X-RAY DIFFRACTION; X-RAY SOURCES; X-RAY SPECTROMETERS; X-ray Spectrometer, crystal, high-resolution

Citation Formats

and Richard Stewart, Michael Haugh. Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer. United States: N. p., 2010. Web. doi:10.1155/2010/583626.
and Richard Stewart, Michael Haugh. Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer. United States. https://doi.org/10.1155/2010/583626
and Richard Stewart, Michael Haugh. 2010. "Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer". United States. https://doi.org/10.1155/2010/583626.
@article{osti_993431,
title = {Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer},
author = {and Richard Stewart, Michael Haugh},
abstractNote = {This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.},
doi = {10.1155/2010/583626},
url = {https://www.osti.gov/biblio/993431}, journal = {X-Ray Optics and Instrumentation},
number = ,
volume = 2010,
place = {United States},
year = {Mon Jun 07 00:00:00 EDT 2010},
month = {Mon Jun 07 00:00:00 EDT 2010}
}