Lateral-Looking Time-Resolved Thermal Wave Microscopy

Journal Article · Sun Aug 01 00:00:00 EDT 2010 · Journal of the Korean Physical Society

DOI:https://doi.org/10.3938/jkps.57.384· OSTI ID:993150

Hurley, David H; Shinde, Subhash; Gusev, Vitalyi

Time-resolved thermal wave microscopy was used to measure lateral thermal transport in a thin metallic film on an insulating substrate. The basis of this approach is to decompose the reflectivity signal into a component that varies with delay time and a steady state component that varies with pump modulation frequency. The transient component is a summation of thermal waves at integral multiples of the pulse repetition frequency (76 MHz). The steady state component depends only on thermal waves at the pump chopping frequency (10-100 kHz). It is shown that for long delays, the steady state component is dominant and can be used to measure the thermal diffusivity.

• Research Organization: Idaho National Lab. (INL), Idaho Falls, ID (United States)
• Sponsoring Organization: DOE - SC
• DOE Contract Number: DE-AC07-05ID14517
• OSTI ID: 993150
• Report Number(s): INL/JOU-10-19094; TRN: US201023%%247
• Journal Information: Journal of the Korean Physical Society, Vol. 57, Issue 2; ISSN 0374-4884
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
MICROSCOPY
MODULATION
REFLECTIVITY
THERMAL DIFFUSIVITY
TRANSIENTS
TRANSPORT
thermal transport
time resolved