Dynamic Behavior in Piezoresponse Force Microstopy

Journal Article · Sun Jan 01 04:00:00 UTC 2006 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/17/6/014· OSTI ID:978161

Jesse, Stephen ^[1]; Baddorf, Arthur P ^[1]; Kalinin, Sergei V ^[1]

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1. ORNL

Frequency-dependent dynamic behavior in piezoresponse force microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analysed using a combination of modelling and experimental measurements. The PFM signal is comprised of contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the flexural and torsional oscillations of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric parameters of the system, on the stiffnesses and frictional forces of the tip-surface junction, and on the frequency of operation. The dynamic signal formation mechanism in PFM is analysed and conditions for optimal PFM imaging are formulated. An experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: ORNL LDRD Seed-Money
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 978161
• Journal Information: Nanotechnology, Journal Name: Nanotechnology Journal Issue: 6 Vol. 17
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
ATOMIC FORCE MICROSCOPY
DYNAMICS
ELECTROSTATICS
FREQUENCY DEPENDENCE
OSCILLATIONS
PERFORMANCE
PIEZOELECTRICITY
RESPONSE FUNCTIONS