SciTech Connect

Title: What Can DMIS 5.2 Do For You?

What Can DMIS 5.2 Do For You? The Dimensional Measuring Interface Standard (DMIS) is the first data interoperability protocol standard created specifically for dimensional metrology. DMIS applications are multi-facetted. The standard can behave as a coordinate metrology language to execute measurement part programs, or it can be used as a neutral data exchange mechanism for part programs and measurement results. DMIS is full featured and has many successful implementations. It also has a strong reputation as a progressive standard, one that has been responsive to user needs and technology advances. It is maintained and improved upon by a volunteer committee, the DMIS Standards Committee (DSC), under the auspices of the Dimensional Metrology Standards Consortium (DMSC Inc.). DMIS has progressed as its eighth version and its sixth as a national and/or international standard. Some notable advances of DMIS have included: • support for thin-walled (i.e., sheet-metal) measurements • alignment with American and International tolerancing standards • complete suite of measure features • harmonization with complementary standards and specifications • extension of additional sensors and scanning processes • introduction of measurement uncertainty computations • tighter CAD associativity • enhancements for multi-axis scanning • provisioning for functional subsets (application profiles) • progression of conformance class validations • designation of key characteristics with criticality designators • removal of ambiguities and syntactic limitations • clarification through additional diagrams and code fragments • resolution to over 600 standard improvement requests
Authors:
Publication Date:
OSTI Identifier:OSTI ID: 972917
Report Number(s):KCP-613-8629
TRN: US201005%%377
DOE Contract Number:DE-AC04-01AL66850
Resource Type:Journal Article
Resource Relation:Journal Name: CMM Quarterly Online's (www.cmmquarterly.com) special issue on the Dimensional Metrology Standards Consortium
Research Org:Kansas City Plant (KCP), Kansas City, MO (United States)
Sponsoring Org:USDOE National Nuclear Security Administration (NA)
Country of Publication:United States
Language:English
Subject: 97 MATHEMATICAL METHODS AND COMPUTING; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; D CODES; STANDARDS; METRICS; USES