Plasma spectroscopy diagnostics in pulsed-power X-ray radiography diode research.
- Weizmann Institute of Science, Rehovot, Israel
- Mission Research Corporation, Albuquerque, NM
- University of New Mexico, Albuquerque, NM
- Bechtel-Nevada, Las Vegas, NV
Spectroscopic investigations in the visible and near UV are underway to study plasmas present in X-ray radiography diodes during the time of the electron beam propagation. These studies are being performed on the RITS-3 accelerator (5.25 MV and 120 kA) at Sandia National Laboratories using several diode configurations. The proper characterization of the plasmas occurring during the time of the X-ray pulse can lead to a greater understanding of diode behavior and X-ray spot size evolution. By studying these plasmas along with the use of selective dopants, insights into such phenomena as impedance collapse, thermal and non-thermal species behavior, charge and current neutralization, anode and cathode plasma formation and propagation, and beam/foil interactions, can be obtained. Information from line and continuum emission and absorption can give key plasma parameters such as temperatures, densities, charge states, and expansion velocities. This information is important for proper modeling and future predictive capabilities for the design and improvement of flash X-ray radiography diodes. Diagnostics include a gated, intensified multichannel plate camera combined with a 1 meter Czerny-Turner monochromator with a multi-fiber spectral input, allowing for both temporal and spatial resolution. Recent results are presented.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 967804
- Report Number(s):
- SAND2005-4781C; TRN: US0904552
- Resource Relation:
- Conference: Proposed for presentation at the 15th IEEE International Pulsed Power Conference held June 13-17, 2005 in Monterey, CA.
- Country of Publication:
- United States
- Language:
- English
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