Detector solid angle formulas for use in x-ray energy dispersive spectrometry.

Journal Article · Thu Jan 01 00:00:00 EST 2009 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927609090217· OSTI ID:967265

Zaluzec, N J

With the advent of silicon drift X-ray detectors, a range of new geometries has become possible in electron optical columns. Because of their compact size, these detectors can potentially achieve high geometrical collection efficiencies; however, using traditional approximations detector solid angle calculations rapidly break down and at times can yield nonphysical values. In this article we present generalized formulas that can be used to calculate the variation in detection solid angle for contemporary Si(Li) as well as new silicon drift configurations.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 967265
• Report Number(s): ANL/MSD/JA-65489; MIMIF7; TRN: US0904277
• Journal Information: Microscopy and Microanalysis, Vol. 15, Issue 2 ; 2009; ISSN 1431-9276
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
APPROXIMATIONS
X-RAY DETECTION
LI-DRIFTED SI DETECTORS
EQUATIONS