The development and relaxation of growth strains in thermally grown Al{sub 2}O{sub 3} scales.
The strains in alumina thin films growing on high-temperature alloys at 1,000-1,100 C and during cooling have been successfully measured in-situ using a novel x-ray technique, exploiting synchrotron radiation at the Advanced Photon Source at Argonne National Laboratory. This paper summarizes results obtained from model alloys, with or without the presence of a reactive element, such as Zr, Hf, and Y, to show the importance of the dynamic nature of the stress evolution process and the effects of alloy composition on the generation and relaxation of these stresses.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 966337
- Report Number(s):
- ANL/MSD/JA-64563; JOMMER; TRN: US0903944
- Journal Information:
- J. Mater., Vol. 61, Issue 7 ; 2009; ISSN 1047-4838
- Country of Publication:
- United States
- Language:
- ENGLISH
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