An annular Si drift detector mu PIXE system using AXSIA analysis.
Journal Article
·
· Proposed for publication in X-Ray Spectrometry.
OSTI ID:964530
- University of Padua and INFN, Italy
- RONTEC GMBH, Berlin, Germany
Sandia and Rontec have developed an annular, 12-element, 60 mm{sup 2}, Peltier-cooled, translatable, silicon drift detector called the SDD-12. The body of the SDD-12 is only 22.8 mm in total thickness and easily fits between the sample and the upstream wall of the Sandia microbeam chamber. At a working distance of 1 mm, the solid angle is 1.09 sr. The energy resolution is 170 eV at count rates <40 kcps and 200 eV for rates of 1 Mcps. X-ray count rates must be maintained below 50 kcps when protons are allowed to strike the full area of the SDD. Another innovation with this new {mu}PIXE system is that the data are analyzed using Sandia's Automated eXpert Spectral Image Analysis (AXSIA).
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 964530
- Report Number(s):
- SAND2004-3652J; TRN: US0903869
- Journal Information:
- Proposed for publication in X-Ray Spectrometry., Journal Name: Proposed for publication in X-Ray Spectrometry.
- Country of Publication:
- United States
- Language:
- English
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