Impact of dislocation cell elastic strain variations on line profiles from deformed copper.
Energy scanned, sub-micrometer X-ray beams were used to obtain diffraction line profiles from individual dislocation cells in copper single crystals deformed in compression. Sub-micrometer depth resolution was provided by translating a wire through the diffracted beams and using triangulation to determine the depths of the diffracting volumes. Connection to classic volume-averaged results was made by adding the line profiles from 52 spatially resolved dislocation cell measurements. The resulting sub profile is smooth and symmetric, in agreement with early assumptions; the mean strain and full width half maximum are consistent with the average of the parameters extracted from the more exact individual dislocation cell measurements.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 963866
- Report Number(s):
- ANL/XSD/JA-65039; TRN: US200918%%180
- Journal Information:
- Z. Kristallogr., Vol. Suppl. 27, Issue 2008
- Country of Publication:
- United States
- Language:
- ENGLISH
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