Effects of Surface Processing on the Response of CZT Gamma Detectors: Studies with a Collimated Synchrotron X-Ray Beam
Using a microscale X-ray mapping technique incorporating a synchrotron beam, we are able to reveal the fine details of the surface properties in cadmium zinc telluride (CZT) semiconductor detectors. A detector, with various degrees of surface roughness, was irradiated by a high-spatial-resolution X-ray beam. The detector's response was analyzed and displayed as a two-dimensional (2-D) map, and the charge collection was obtained from the peak positions in the spectra versus the beam's location, which reflects the local material properties. We noted the correlation between the 2-D image and the spectral response of the charge collection at different locations on the surface area, which indicates that a rough surface tends to contain trapping centers, thereby enhancing leakage current and distorting the signal. We also discuss our observations on the transition effect at the boundary area of a rough and a smooth surface under identical conditions.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 960057
- Report Number(s):
- BNL-83043-2009-JA; JECMA5; TRN: US1005892
- Journal Information:
- Journal of Electronic Materials, Vol. 37; ISSN 0361-5235
- Country of Publication:
- United States
- Language:
- English
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