NEXAFS Microscopy and Resonant Scattering: Composition and Orientation Probed in Real and Reciprocal Space
Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized, synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at {approx}30 nm spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution (<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conventional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and discuss a number of applications to exemplify their unique aspects.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 959879
- Report Number(s):
- BNL-82865-2009-JA; POLMAG; TRN: US1005819
- Journal Information:
- Polymer, Vol. 49, Issue 3; ISSN 0032-3861
- Country of Publication:
- United States
- Language:
- English
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