Resonance Frequency Analysis for Surface-Coupled AFM Cantilever in Liquids

Journal Article · Tue Jan 01 00:00:00 EST 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2801524· OSTI ID:958824

Mirman, B ^[1]; Kalinin, Sergei V ^[2]

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1. Suffolk University, Boston
2. ORNL

Shifts in the resonance frequencies of surface-coupled atomic force microscope (AFM) probes are used as the basis for the detection mechanisms in a number of scanning probe microscopy techniques including atomic force acoustic microscopy (AFAM), force modulation microscopy, and resonance enhanced piezoresponse force microscopy (PFM). Here, we analyze resonance characteristics for AFM cantilever coupled to surface in liquid environment, and derive approximate expressions for resonant frequencies as a function of vertical and lateral spring constant of the tip-surface junction. This analysis provides a simplified framework for the interpretation of AFAM and PFM data in ambient, liquid, and vacuum environments.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 958824
• Journal Information: Applied Physics Letters, Vol. 92, Issue 8; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACOUSTIC MICROSCOPY
DETECTION
FREQUENCY ANALYSIS
MICROSCOPES
MICROSCOPY
MODULATION
RESONANCE
ATOMIC FORCE MICROSCOPY