In situ HREM observation of the oxidation of nickel thin foils

Conference · Fri Sep 01 00:00:00 EDT 1995

OSTI ID:94059

Thien-Nga, L; Hutchison, J L; Derby, B ^[1]

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1. Univ. of Oxford (United Kingdom). Dept. of Materials

Growth of oxide microcrystals at the edge of nickel grains could be observed using high-resolution microscopy. Three types of samples were examined: a nickel-cermet material, and pure annealed nickel, both ion-beam milled; and a standard electropolished nickel foil. Microstructural features, such as crystallite size, facets, orientation relationship and lattice parameter are described. The observations were performed with a JEOL 4000 EX II microscope. The point resolution at 400kV is 1.6{angstrom}. The largest interplanar spacing in Ni is 2.03{angstrom} = d(111), and <110> is the only imaging axis which allows lattice imaging.

• OSTI ID: 94059
• Report Number(s): CONF-941144-; ISBN 1-55899-258-8; TRN: IM9538%%32
• Resource Relation: Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of Structure and properties of interfaces in ceramics; Bonnell, D. [ed.] [Univ. of Pennsylvania, PA (United States)]; Ruehle, M. [ed.] [Max-Planck-Institut fuer Metallforschung, Stuttgart (Germany)]; Chowdhry, U. [ed.] [E.I. duPont de Nemours and Co., Inc., Wilmington, DE (United States)]; PB: 481 p.; Materials Research Society symposium proceedings, Volume 357
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COMPOSITE MATERIALS
MICROSTRUCTURE
NICKEL
OXIDATION
ALUMINIUM OXIDES
SAMPLE PREPARATION
TRANSMISSION ELECTRON MICROSCOPY
GRAIN SIZE
ORIENTATION
LATTICE PARAMETERS
SIMULATION
KINETICS
INTERFACES
STRAINS