Determination of pattern centre in EBSD using the moving-screen technique

Journal Article · Sat Sep 01 00:00:00 EDT 2007 · Journal of Microscopy

OSTI ID:932170

Richardson, Dave ^[1]; Carpenter, D A ^[2]; Pugh, J L ^[2]; Mooney, L R ^[2]

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1. ORNL
2. Y-12 National Security Complex

The 'moving-screen' or 'pattern magnification' method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high-precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). National Center for Computational Sciences (NCCS)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 932170
• Journal Information: Journal of Microscopy, Vol. 227, Issue 3
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
CALIBRATION
ELECTRON DIFFRACTION
BACKSCATTERING
DIFFRACTOMETERS