Temperature Dependence of Surface Layering in a Dielectric Liquid
Journal Article
·
· Physical Review B: Condensed Matter and Materials Physics
The temperature dependence of the density oscillations (layers) at the free surface of tetrakis(2-ethylhexoxy)silane, a nonmetallic molecular liquid, was investigated using x-ray reflectivity. Below {approx}215K , the layer parameters weakly vary with temperature, if at all. Above this temperature, the layer spacings and intrinsic layer widths increase continuously, until there is no identifiable layering above 230K . This transition occurs at T/{Tc}{approx}0.23 , a temperature region that is usually accessible in metallic liquids but is preempted by freezing in many dielectric liquids.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 930515
- Report Number(s):
- BNL-80500-2008-JA; TRN: US200904%%762
- Journal Information:
- Physical Review B: Condensed Matter and Materials Physics, Vol. 76, Issue 2; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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