Characterization of phase evolution in YBCO coated conductors produced by the ex situ BaF{sub 2} process.

Journal Article · Fri Jun 01 00:00:00 EDT 2007 · IEEE Trans. Appl. Supercond.

DOI:https://doi.org/10.1109/TASC.2007.899994· OSTI ID:915035

Feenstra, R; List, F A; Zhang, Y; Christen, D K; Maroni, V A; Miller, D J; Feldmann, D M; ORNL,

Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF2 ex situ process. For quenched films of 2 mum thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 mum suggest a weak thickness dependence.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 915035
• Report Number(s): ANL/CMT/JA-59932; TRN: US200817%%71
• Journal Information: IEEE Trans. Appl. Supercond., Vol. 17, Issue 2 ; Jun. 2007
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

36 MATERIALS SCIENCE
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
NUCLEATION
CRYSTAL GROWTH
BARIUM FLUORIDES
PHASE STUDIES
THIN FILMS