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Title: Model for l/f Flux Noise in SQUIDs and Qubits

Model for l/f Flux Noise in SQUIDs and Qubits We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by a plausible density of randomly oriented defects yield 1/f noise magnitudes in good agreement with experiments.
Authors: ; ;
Publication Date:
OSTI Identifier:OSTI ID: 913162
Report Number(s):LBNL--62393
Journal ID: ISSN 0031-9007; PRLTAO; R&D Project: 504801; BnR: KC0202020; TRN: US0800653
DOE Contract Number:DE-AC02-05CH11231
Resource Type:Journal Article
Resource Relation:Journal Name: Physical Review Letters; Journal Volume: 98; Journal Issue: 26; Related Information: Journal Publication Date: 06/2007
Research Org:COLLABORATION - IBM
Country of Publication:United States
Language:English
Subject: 75; DEFECTS; DISTRIBUTION; ELECTRONS; GROUND STATES; MAGNETIC MOMENTS; ORIENTATION; QUBITS; SUPERCONDUCTING DEVICES; TRAPPED ELECTRONS