Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering

Journal Article · Thu Dec 01 00:00:00 EST 2005 · Journal of Physics and Chemistry of Solids

DOI:https://doi.org/10.1016/j.jpcs.2005.09.077· OSTI ID:898741

Alatas, A. ^[1]; Said, A. H. ^[2]; Sinn, H. ^[1]; Alp, E. E. ^[1]; Kodituwakku, C. N. ^[2]; Reinhart, B. ^[3]; Saboungi, M. -L. ^[4]; Price, D. L. ^[5]

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1. Argonne National Lab. (ANL), Argonne, IL (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States); Western Michigan Univ., Kalamazoo MI (United States)
3. Argonne National Lab. (ANL), Argonne, IL (United States); Purdue Univ., West Lafayette, IN (United States)
4. CRMD, Orleans (France)
5. CRMTH, Orleans (France)

We measured the dynamical structure factors of supercooled-liquid and hot-solid silicon by inelastic X-ray scattering at the same temperature, 1620 K. Two significant changes in the averaged longitudinal sound velocities and in the longitudinal modulus are observed. We, first observe a different longitudinal modulus in the polycrystalline hot-solid silicon compared to the extrapolated value obtained from the single-crystal measurement. Furthermore, this reduction of the modulus may be a precursor of the semiconductor-to-metal transition. Second, the increase in the longitudinal modulus in the liquid upon supercooling is consistent with an increase in the degree of the directional bonding.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 898741
• Journal Information: Journal of Physics and Chemistry of Solids, Vol. 66, Issue 12; Related Information: Dec. 2005; ISSN 0022-3697
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
INELASTIC SCATTERING
SILICON
X-RAY DIFFRACTION
ELASTICITY
TEMPERATURE RANGE
advanced photon source