Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy
Abstract
Quantitative x-ray diffraction (XRD) and high resolution electron microscopy (HREM) have been applied to the analysis of an epitaxial CoO/NiO superlattice. This example shows that the qualitative information determined directly from a XRD spectrum or HREM image is limited and can even be misleading. However, by a combination of quantitative intensity measurements and structural modeling, a detailed quantitative characterization of the superlattice structure is possible.
- Authors:
-
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- Department of Materials Science and Mineral Engineering and National Center for Electron Microscopy, University of California-Berkeley, Berkeley, California 94720 (United States)
- Department of Physics 0319, University of California-San Diego, La Jolla, California 92093-0319 (United States)
- Center for Magnetic Recording Research 0401, University of California-San Diego, La Jolla, California 92093-0401 (United States)
- Publication Date:
- OSTI Identifier:
- 7369169
- DOE Contract Number:
- AC03-76SF00098; FG03-87ER45332; W-31109-ENG-38
- Resource Type:
- Journal Article
- Journal Name:
- Applied Physics Letters; (United States)
- Additional Journal Information:
- Journal Volume: 63:4; Journal ID: ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; COBALT OXIDES; ELECTRON MICROSCOPY; X-RAY DIFFRACTION; NICKEL OXIDES; SUPERLATTICES; CRYSTAL STRUCTURE; DATA ANALYSIS; EPITAXY; INTERFACES; MEASURING METHODS; SIMULATION; THICKNESS; CHALCOGENIDES; COBALT COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; 665100* - Nuclear Techniques in Condensed Matter Physics - (1992-); 360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies
Citation Formats
Fullerton, E E, Cao, W, Thomas, G, Schuller, I K, Carey, M J, and Berkowitz, A E. Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy. United States: N. p., 1993.
Web. doi:10.1063/1.110030.
Fullerton, E E, Cao, W, Thomas, G, Schuller, I K, Carey, M J, & Berkowitz, A E. Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy. United States. https://doi.org/10.1063/1.110030
Fullerton, E E, Cao, W, Thomas, G, Schuller, I K, Carey, M J, and Berkowitz, A E. 1993.
"Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy". United States. https://doi.org/10.1063/1.110030.
@article{osti_7369169,
title = {Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy},
author = {Fullerton, E E and Cao, W and Thomas, G and Schuller, I K and Carey, M J and Berkowitz, A E},
abstractNote = {Quantitative x-ray diffraction (XRD) and high resolution electron microscopy (HREM) have been applied to the analysis of an epitaxial CoO/NiO superlattice. This example shows that the qualitative information determined directly from a XRD spectrum or HREM image is limited and can even be misleading. However, by a combination of quantitative intensity measurements and structural modeling, a detailed quantitative characterization of the superlattice structure is possible.},
doi = {10.1063/1.110030},
url = {https://www.osti.gov/biblio/7369169},
journal = {Applied Physics Letters; (United States)},
issn = {0003-6951},
number = ,
volume = 63:4,
place = {United States},
year = {Mon Jul 26 00:00:00 EDT 1993},
month = {Mon Jul 26 00:00:00 EDT 1993}
}
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