Subsurface flaw detection in reflective materials by thermal transfer imaging

Journal Article · Tue Jan 01 00:00:00 EST 1991 · Optical Engineering; (United States)

DOI:https://doi.org/10.1117/12.55760· OSTI ID:7086887

Maldague, X ^[1]; Krapez, J C; Cielo, P ^[2]

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1. Univ. Laval, Electrical Engineering Dept., Quebec City, Quebec G1K 7P4 (CA)
2. National Research Council Canada, Industrial Materials Inst., 75 de Mortagne Boulevard, Boucherville, Quebec J4B 6Y4 (CA)

In this paper a thermal imaging apparatus is described for the nondestructive detection of subsurface defects in materials that would not usually lend themselves to thermal imaging because of their low emissivity and high susceptibility to background reflection noise. This is accomplished by transferring the thermal image produced by surface temperature perturbation of the workpiece material to a high emissivity material with which it is continuously brought in contact. The transferred thermal image may be observed by a suitable infrared device, resulting in a high radiance image with minimum reflectivity or variable emissivity noise. Numerical simulations, as well as experimental results, are presented.

• OSTI ID: 7086887
• Journal Information: Optical Engineering; (United States), Vol. 30:1; ISSN 0091-3286
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
SURFACE PROPERTIES
INFRARED THERMOGRAPHY
CRYSTAL DEFECTS
EXPERIMENTAL DATA
NONDESTRUCTIVE TESTING
REFLECTION
SIMULATION
CRYSTAL STRUCTURE
DATA
INFORMATION
MATERIALS TESTING
MEASURING METHODS
NUMERICAL DATA
TESTING
THERMOGRAPHY
440500* - Thermal Instrumentation- (1990-)
990200 - Mathematics & Computers