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Title: Cathodic deposition of amorphous alloys of silicon, carbon, and fluorine

Journal Article · · J. Electrochem. Soc.; (United States)
DOI:https://doi.org/10.1149/1.2124069· OSTI ID:7012192

Amorphous silicon containing fluorine and carbon, pure and doped with boron or phosphorus, was deposited cathodically from solutions of K/sub 2/SiF/sub 6/ in acetone with HF. The conditions for optimum deposition were determined, and the deposits were characterized by electron microprobe x-ray emission, electrical conductivity, and infrared absorption. Doping with phosphorus causes a change from p- to n-type semiconductor behavior, with a maximum of resistivity >10/sup 13/ /OMEGA/ cm at the compensation point. 48 refs.

Research Organization:
Univ of South Calif, Los Angeles, USA
OSTI ID:
7012192
Journal Information:
J. Electrochem. Soc.; (United States), Vol. 129:5
Country of Publication:
United States
Language:
English