Radiation characterization of a C256 EEPROM
- Sandia National Labs., Albuquerque, NM (US)
Total dose, dose-rate and high dose-rate memory retention results are presented for the SEEQ Technologies Inc., 28C256 floating gate electrically erasable programmable read only memory (EEPROM). Total dose failure levels are mode dependent, i.e. {approximately}33 krad(Si) for reading and {approximately}9.5 krad(Si) for writing. The write-mode failure level is dose-rated dependent, increasing from {approximately}10 krad(Si) at {approximately}11 rad(Si)/s to {approximately} 28 krad(Si) at dose rates {approximately}0,1 rad(Si)/s Average upset and latch-up thresholds are 3.8 {times} 10{sup 8} rad(Si)/s and 7.7 {times} 10{sup 8} rad(Si)/s respectively. No latch-up windows were observed. Memory contents were retained following exposure up to 108 krad (Si) and following 1 {times} 10{sup 12} rad(Si)/s.
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 7002186
- Report Number(s):
- CONF-890723-; CODEN: IETNA; TRN: 90-014116
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Vol. 36:6; Conference: 26. annual conference on nuclear and space radiation effects, Marco Island, FL (USA), 25-29 Jul 1989; ISSN 0018-9499
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
MEMORY DEVICES
RADIATION HARDENING
SILICON
DOSE RATES
RADIATION DOSES
DOSES
ELEMENTS
HARDENING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SEMIMETALS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems
360605 - Materials- Radiation Effects